Congratulations! Two groups of students won the best award in 2020 IEEM senior project exhibition!
基於擴增實境之半導體智慧巡檢技術團隊
基於擴增實境介面之智能化軸連結器辨識技術團隊
合照
AR based Smart Inspection Technology for Semiconductor Equipment (基於擴增實境之半導體智慧巡檢技術) and Intelligent Flange Spec Recognition Technology using AR technology (基於擴增實境介面之智能化軸連結器辨識技術) won the best senior project in 2020!
